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數百萬庫存的電子零件。 接受缺貨訂單。 24小時內的價格和交貨時間報價。

SN74BCT8244ADW

SN74BCT8244ADW

僅供參考

型號 SN74BCT8244ADW
PNEDA編號 SN74BCT8244ADW
描述 IC SCAN TEST DEVICE BUFF 24-SOIC
制造商 Texas Instruments
單價
1 ---------- $110.8475
50 ---------- $105.6515
100 ---------- $100.4555
200 ---------- $95.2596
400 ---------- $90.9296
500 ---------- $86.5996
庫存 2,888
倉庫 Shipped from Hong Kong SAR
預計交貨 五月 11 - 五月 16 (選擇加急運輸)
Guarantee 可達壹年的[PNEDA-Warranty]*

SN74BCT8244ADW資源

品牌 Texas Instruments
ECAD Module ECAD
制造商零件編號SN74BCT8244ADW
類別半導體邏輯IC邏輯-專業邏輯

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SN74BCT8244ADW規格

制造商
系列74BCT
邏輯類型Scan Test Device with Buffers
電源電壓4.5V ~ 5.5V
位數8
工作溫度0°C ~ 70°C
安裝類型Surface Mount
包裝/箱24-SOIC (0.295", 7.50mm Width)
供應商設備包裝24-SOIC

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